• DocumentCode
    3058173
  • Title

    MOCVD growth of gallium nitride

  • Author

    Thrush, E.J. ; Crawley, J.A. ; Van Der Stricht, W. ; Moerman, I. ; May, L. ; Nicholls, E. ; Vergani, G.

  • Author_Institution
    Thomas Swan & Co., Cambridge, UK
  • fYear
    1996
  • fDate
    35354
  • Firstpage
    42401
  • Lastpage
    210
  • Abstract
    The group III nitrides represent an important class of materials with applications in high temperature electronics, optoelectronic devices operating in the blue to near UV region of the spectrum, and cold cathodes. Owing to their combination of wide band gap, high thermal conductivity, high thermal stability and physical robustness they offer, in principle, an attractive route to such devices. Their are however severe practical difficulties in their preparation which have prevented the realisation of their potential until quite recently. This paper outlines the considerations which have determined the design of this reactor and report on the growth experiments which have been undertaken at Gent. Results are also presented to illustrate the characteristics of the material which has been grown to date
  • Keywords
    gallium compounds; GaN; MOCVD growth; cold cathodes; group III nitrides; high temperature electronics; optoelectronic devices; physical robustness; thermal conductivity; thermal stability; wide band gap;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Wide Bandgap Semiconductor Light Emitters (Digest No: 1996/233), IEE Colloquium on
  • Conference_Location
    London
  • Type

    conf

  • DOI
    10.1049/ic:19961223
  • Filename
    641908