DocumentCode
305828
Title
Statistical Analysis And Somk Polarimetric Signatures Of A Polarimetric Synthetic Aperturk Radar Image
Author
Walther, M. ; Kostinski, A.B. ; Eom, Hyo J. ; Boerner, Wolfgang-Martin
Author_Institution
Communications Laboratory (M/C 154 ) Department of Electrical Engr. & Comp. Science University of Illinois at Chicagor Chicago, IL USA 60680-4348
Volume
1
fYear
1988
fDate
12-16 Sept. 1988
Firstpage
59
Lastpage
64
Keywords
Light scattering; Radar polarimetry; Radar scattering; Rayleigh scattering; Rough surfaces; Sea surface; Speckle; Statistical analysis; Statistics; Surface roughness;
fLanguage
English
Publisher
ieee
Conference_Titel
Geoscience and Remote Sensing Symposium, 1988. IGARSS '88. Remote Sensing: Moving Toward the 21st Century., International
Conference_Location
Edinburgh, UK
Type
conf
DOI
10.1109/IGARSS.1988.570050
Filename
570050
Link To Document