DocumentCode :
305828
Title :
Statistical Analysis And Somk Polarimetric Signatures Of A Polarimetric Synthetic Aperturk Radar Image
Author :
Walther, M. ; Kostinski, A.B. ; Eom, Hyo J. ; Boerner, Wolfgang-Martin
Author_Institution :
Communications Laboratory (M/C 154 ) Department of Electrical Engr. & Comp. Science University of Illinois at Chicagor Chicago, IL USA 60680-4348
Volume :
1
fYear :
1988
fDate :
12-16 Sept. 1988
Firstpage :
59
Lastpage :
64
Keywords :
Light scattering; Radar polarimetry; Radar scattering; Rayleigh scattering; Rough surfaces; Sea surface; Speckle; Statistical analysis; Statistics; Surface roughness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Geoscience and Remote Sensing Symposium, 1988. IGARSS '88. Remote Sensing: Moving Toward the 21st Century., International
Conference_Location :
Edinburgh, UK
Type :
conf
DOI :
10.1109/IGARSS.1988.570050
Filename :
570050
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=305828
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