Title :
Efficient routability checking for global wires in planar layouts
Author :
Iso, Naoyuki ; Kawaguchi, Yasushi ; Hirata, Tomio
Author_Institution :
Fac. of Eng., Nagoya Univ., Japan
Abstract :
In VLSI and printed wiring board design, routing process usually consists of two stages: the global routing and the detailed routing. The routability checking is to decide whether the global wires can be transformed into the detailed ones or not. In this paper, we propose two graphs, the capacity checking graph and the initial flow graph, for the efficient routability checking
Keywords :
VLSI; circuit layout CAD; computational complexity; graph theory; integrated circuit layout; integrated circuit testing; network routing; printed circuit layout; printed circuit testing; IC layout; VLSI; capacity checking graph; circuit testing; global wires; initial flow graph; planar layouts; printed wiring board; routability checking; Algorithm design and analysis; Flow graphs; Joining processes; Lattices; Routing; Testing; Topology; Very large scale integration; Wires; Wiring;
Conference_Titel :
Design Automation Conference, 1997. Proceedings of the ASP-DAC '97 Asia and South Pacific
Conference_Location :
Chiba
Print_ISBN :
0-7803-3662-3
DOI :
10.1109/ASPDAC.1997.600348