Title :
Fault tolerant interconnect for on-wafer processor communication
Author :
Youn, Hee Yong ; Singh, Adit D.
Author_Institution :
Dept. of Comput. Sci., North Texas Univ., Denton, TX, USA
Abstract :
A fault-tolerance scheme for efficiently reconfiguring the two-dimensional processor arrays implemented on a wafer is presented. This scheme can achieve near optimal yield for the target array, using minimal redundant circuits (processors and interconnection buses). It also displays short maximum restructured edge length. The scheme achieves high efficiency by maximally sharing the utilization of good processors between adjacent rows. The scheme is expected to be easily applicable to other topologies, and the cube-connected cycles network has shown to be efficiently reconfigured using it
Keywords :
VLSI; computer interfaces; fault tolerant computing; microprocessor chips; cube-connected cycles network; fault tolerant interconnect; interconnection buses; on-wafer processor communication; two-dimensional processor arrays; Circuit faults; Clustering algorithms; Delay; Displays; Fault tolerance; Fault tolerant systems; Integrated circuit interconnections; Target recognition; Topology; Very large scale integration;
Conference_Titel :
Communications, 1990. ICC '90, Including Supercomm Technical Sessions. SUPERCOMM/ICC '90. Conference Record., IEEE International Conference on
Conference_Location :
Atlanta, GA
DOI :
10.1109/ICC.1990.117183