DocumentCode :
3059091
Title :
Clustering phenomena considering the density of coupled chaotic circuits networks
Author :
Takamaru, Yusuke ; Uwate, Yoko ; Ott, Tammy ; Nishio, Yusuke
Author_Institution :
Dept. of Electr. & Electron. Eng., Tokushima Univ., Tokushima, Japan
fYear :
2012
fDate :
2-5 Dec. 2012
Firstpage :
647
Lastpage :
650
Abstract :
We have investigated the clustering phenomena observed from coupled chaotic circuits networks. The networks are globally coupled with each other by resistor using the distance information. The coupling strength is depended on the distance between the circuits. In this study, we consider the relationship between density and distance of each cluster that configured by chaotic circuits. For this investigation, we study the clustering phenomena when we change the number of circuits in a cluster. Furthermore, we consider the clustering phenomena by changing the distance between each cluster composed of chaotic circuits using 2-dimensional place.
Keywords :
chaos; resistors; clustering phenomena; coupled chaotic circuit networks; coupling strength; distance information; resistor; Chaos; Clustering algorithms; Computer simulation; Couplings; Integrated circuit modeling; Mathematical model; Synchronization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (APCCAS), 2012 IEEE Asia Pacific Conference on
Conference_Location :
Kaohsiung
Print_ISBN :
978-1-4577-1728-4
Type :
conf
DOI :
10.1109/APCCAS.2012.6419118
Filename :
6419118
Link To Document :
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