Title :
Clustering phenomena considering the density of coupled chaotic circuits networks
Author :
Takamaru, Yusuke ; Uwate, Yoko ; Ott, Tammy ; Nishio, Yusuke
Author_Institution :
Dept. of Electr. & Electron. Eng., Tokushima Univ., Tokushima, Japan
Abstract :
We have investigated the clustering phenomena observed from coupled chaotic circuits networks. The networks are globally coupled with each other by resistor using the distance information. The coupling strength is depended on the distance between the circuits. In this study, we consider the relationship between density and distance of each cluster that configured by chaotic circuits. For this investigation, we study the clustering phenomena when we change the number of circuits in a cluster. Furthermore, we consider the clustering phenomena by changing the distance between each cluster composed of chaotic circuits using 2-dimensional place.
Keywords :
chaos; resistors; clustering phenomena; coupled chaotic circuit networks; coupling strength; distance information; resistor; Chaos; Clustering algorithms; Computer simulation; Couplings; Integrated circuit modeling; Mathematical model; Synchronization;
Conference_Titel :
Circuits and Systems (APCCAS), 2012 IEEE Asia Pacific Conference on
Conference_Location :
Kaohsiung
Print_ISBN :
978-1-4577-1728-4
DOI :
10.1109/APCCAS.2012.6419118