Title :
The consequences of diffractively spreading beams in ultrafast THz spectroscopy
Author :
Bowen, J.W. ; Walker, G.C. ; Hadjiloucas, S. ; Berry, E.
Author_Institution :
Dept. of Cybern., Reading Univ., UK
fDate :
27 Sept.-1 Oct. 2004
Abstract :
There are established methods for calculating optical constants from measurements using a broadband terahertz (THz) source. Applications to ultrafast THz spectroscopy have adopted the key assumption that the THz beam is treated as a normal incidence plane-wave. We show that this assumption results in a frequency-dependent systematic error, which is compounded by distortion of the beam on introduction of the sample.
Keywords :
II-VI semiconductors; Pockels effect; electro-optical devices; high-speed optical techniques; refractive index; submillimetre wave detectors; submillimetre wave imaging; submillimetre wave spectra; zinc compounds; THz beam; broadband THz source; broadband terahertz source; frequency dependent systematic error; normal incidence plane wave; optical constants; terahertz beam; ultrafast THz spectroscopy; ultrafast terahertz spectroscopy; Biomedical imaging; Biomedical optical imaging; Diffraction; Frequency; Optical attenuators; Optical distortion; Optical imaging; Optical refraction; Optical variables control; Spectroscopy;
Conference_Titel :
Infrared and Millimeter Waves, 2004 and 12th International Conference on Terahertz Electronics, 2004. Conference Digest of the 2004 Joint 29th International Conference on
Print_ISBN :
0-7803-8490-3
DOI :
10.1109/ICIMW.2004.1422208
