• DocumentCode
    3059277
  • Title

    Efficiently Running Test Suites Using Abstract Undo Operations

  • Author

    Khalek, Shadi Abdul ; Khurshid, Sarfraz

  • Author_Institution
    Univ. of Texas at Austin, Austin, TX, USA
  • fYear
    2011
  • fDate
    Nov. 29 2011-Dec. 2 2011
  • Firstpage
    110
  • Lastpage
    119
  • Abstract
    The last decade has seen many advances in test input generation, specifically using systematic approaches that can enumerate many tests. While such approaches have enhanced our ability to find bugs in programs, running large numbers of tests remains a time consuming and expensive task, especially for tests that execute operations on external resources, such as a file system or a network. This paper presents a novel technique for optimizing execution of suites of tests, where several tests in a suite may contain common initial execution -- a property often exhibited by systematically generated suites, e.g., those for bounded exhaustive testing. Our insight is that we can cluster execution of such tests by defining abstract-level undo operations, which allow a common execution segment to be performed once, and its result to be shared across the tests, which then perform the rest of their operations. We present our framework for clustered execution of test suites, and evaluate it using three case-studies, which show our technique enables significant performance speed-up over traditional test execution.
  • Keywords
    checkpointing; optimisation; pattern clustering; program debugging; program testing; program verification; abstract level undo operation; bounded exhaustive testing; execution clustering; execution segment; suite execution optimization; systematically generated suites; test input generation; Clustering algorithms; Context; Databases; Instruments; Receivers; Semantics; Testing; check-pointing; test clustering; undo operations; unit test suites;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Reliability Engineering (ISSRE), 2011 IEEE 22nd International Symposium on
  • Conference_Location
    Hiroshima
  • ISSN
    1071-9458
  • Print_ISBN
    978-1-4577-2060-4
  • Type

    conf

  • DOI
    10.1109/ISSRE.2011.20
  • Filename
    6132959