DocumentCode
3059330
Title
PACOGEN: Automatic Generation of Pairwise Test Configurations from Feature Models
Author
Hervieu, Aymeric ; Baudry, Benoit ; Gotlieb, Arnaud
Author_Institution
INRIA Rennes Bretagne Atlantique, Rennes, France
fYear
2011
fDate
Nov. 29 2011-Dec. 2 2011
Firstpage
120
Lastpage
129
Abstract
Feature models are commonly used to specify variability in software product lines. Several tools support feature models for variability management at different steps in the development process. However, tool support for test configuration generation is currently limited. This test generation task consists in systematically selecting a set of configurations that represent a relevant sample of the variability space and that can be used to test the product line. In this paper we propose pw tool to analyze feature models and automatically generate a set of configurations that cover all pair wise interactions between features. pw tool relies on constraint programming to generate configurations that satisfy all constraints imposed by the feature model and to minimize the set of the tests configurations. This work also proposes an extensive experiment, based on the state-of-the art SPLOT feature models repository, showing that pw tool scales over variability spaces with millions of configurations and covers pair wise with less configurations than other available tools.
Keywords
automatic test pattern generation; formal specification; program testing; software development management; software tools; Pacogen; SPLOT feature models; automatic test configuration generation; formal specification; software development; software product lines; software tools; software variability management; Arrays; Data models; Minimization; Optimization; Programming; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Software Reliability Engineering (ISSRE), 2011 IEEE 22nd International Symposium on
Conference_Location
Hiroshima
ISSN
1071-9458
Print_ISBN
978-1-4577-2060-4
Type
conf
DOI
10.1109/ISSRE.2011.31
Filename
6132960
Link To Document