Title :
PACOGEN: Automatic Generation of Pairwise Test Configurations from Feature Models
Author :
Hervieu, Aymeric ; Baudry, Benoit ; Gotlieb, Arnaud
Author_Institution :
INRIA Rennes Bretagne Atlantique, Rennes, France
fDate :
Nov. 29 2011-Dec. 2 2011
Abstract :
Feature models are commonly used to specify variability in software product lines. Several tools support feature models for variability management at different steps in the development process. However, tool support for test configuration generation is currently limited. This test generation task consists in systematically selecting a set of configurations that represent a relevant sample of the variability space and that can be used to test the product line. In this paper we propose pw tool to analyze feature models and automatically generate a set of configurations that cover all pair wise interactions between features. pw tool relies on constraint programming to generate configurations that satisfy all constraints imposed by the feature model and to minimize the set of the tests configurations. This work also proposes an extensive experiment, based on the state-of-the art SPLOT feature models repository, showing that pw tool scales over variability spaces with millions of configurations and covers pair wise with less configurations than other available tools.
Keywords :
automatic test pattern generation; formal specification; program testing; software development management; software tools; Pacogen; SPLOT feature models; automatic test configuration generation; formal specification; software development; software product lines; software tools; software variability management; Arrays; Data models; Minimization; Optimization; Programming; Testing;
Conference_Titel :
Software Reliability Engineering (ISSRE), 2011 IEEE 22nd International Symposium on
Conference_Location :
Hiroshima
Print_ISBN :
978-1-4577-2060-4
DOI :
10.1109/ISSRE.2011.31