Title :
Software Reliability Growth Models Based on Local Polynomial Modeling with Kernel Smoothing
Author :
Dharmasena, L. Sandamali ; Zeephongsekul, P. ; Jayasinghe, Chathuri L.
Author_Institution :
Sch. of Inf. Syst., Deakin Univ., Burwood, VIC, Australia
fDate :
Nov. 29 2011-Dec. 2 2011
Abstract :
Software reliability growth models (SRGMs) are extensively employed in software engineering to assess the reliability of software before their release for operational use. These models are usually parametric functions obtained by statistically fitting parametric curves, using Maximum Likelihood estimation or Least -- squared method, to the plots of the cumulative number of failures observed N(t) against a period of systematic testing time t. Since the 1970s, a very large number of SRGMs have been proposed in the reliability and software engineering literature and these are often very complex, reflecting the involved testing regime that often took place during the software development process. In this paper we extend some of our previous work by adopting a nonparametric approach to SRGM modeling based on local polynomial modeling with kernel smoothing. These models require very few assumptions, thereby facilitating the estimation process and also rendering them more relevant under a wide variety of situations. Finally, we provide numerical examples where these models will be evaluated and compared.
Keywords :
curve fitting; least squares approximations; maximum likelihood estimation; polynomials; rendering (computer graphics); software reliability; SRGM modeling; estimation process; kernel smoothing; least-squared method; local polynomial modeling; maximum likelihood estimation; parametric curve fitting; parametric functions; software development process; software engineering; software reliability growth models; testing time; Bandwidth; Data models; Kernel; Numerical models; Polynomials; Software reliability; Convex combination of estimators; Local polynomial regression; Software reliability growth models;
Conference_Titel :
Software Reliability Engineering (ISSRE), 2011 IEEE 22nd International Symposium on
Conference_Location :
Hiroshima
Print_ISBN :
978-1-4577-2060-4
DOI :
10.1109/ISSRE.2011.10