DocumentCode
3059684
Title
Partially prism-gridded FDTD analysis for layered structures of transversely curved boundary
Author
Chieh-Tsao Hwang ; Ruey-Beei Wu
Author_Institution
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Volume
3
fYear
1998
fDate
7-12 June 1998
Firstpage
1417
Abstract
A partially prism-gridded FDTD analysis is presented to deal with layered structures with curved boundary in transverse directions. It is applied to calculate the scattering parameters of vias in multilayer packaging. The good agreement of the results with those by other methods verifies the accuracy of this analysis.
Keywords
S-parameters; finite difference time-domain analysis; packaging; layered structures; multilayer packaging vias; partially prism-gridded FDTD analysis; scattering parameters; transversely curved boundary; Degradation; Electromagnetic scattering; Finite difference methods; Finite element methods; Geometry; Nonhomogeneous media; Packaging; Solid modeling; Testing; Time domain analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1998 IEEE MTT-S International
Conference_Location
Baltimore, MD, USA
ISSN
0149-645X
Print_ISBN
0-7803-4471-5
Type
conf
DOI
10.1109/MWSYM.1998.700640
Filename
700640
Link To Document