• DocumentCode
    3059975
  • Title

    3300 V, 30 A 4H-SiC power DMOSFETs

  • Author

    Cheng, Lin ; Ryu, Sei-Hyung ; Jonas, Charlotte ; Dhar, Sarit ; Callanan, Robert ; Richmond, Jim ; Agarwal, Anant K. ; Palmour, John

  • fYear
    2009
  • fDate
    9-11 Dec. 2009
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    In summary, high-voltage 3300 V, 30 A 4H-SiC DMOSFETs are demonstrated. The device can conduct over 30 A at a power dissipation of 200 W/cm2 in the on-state and block over 3300 V with a VGS of 0 V in the off-state. The devices exhibit normally-off characteristic. More data including dynamic switching performance of the DMOSFETs will be presented at the conference.
  • Keywords
    power MOSFET; silicon compounds; wide band gap semiconductors; SiC; current 30 A; dynamic switching performance; high-voltage; normally-off characteristic; power DMOSFET; power dissipation; voltage 3300 V; Aluminum; Avalanche breakdown; Educational institutions; Electric breakdown; MOSFETs; Packaging; Photonic band gap; Power dissipation; Silicon carbide; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Device Research Symposium, 2009. ISDRS '09. International
  • Conference_Location
    College Park, MD
  • Print_ISBN
    978-1-4244-6030-4
  • Electronic_ISBN
    978-1-4244-6031-1
  • Type

    conf

  • DOI
    10.1109/ISDRS.2009.5378284
  • Filename
    5378284