DocumentCode
3060205
Title
A deterministic approach to the spatial origin of semiconductor device current noise for semiclassical transport
Author
Noaman, B.A. ; Korman, C.E.
Author_Institution
Dept. of Electr. & Comput. Eng., George Washington Univ., Washington, DC, USA
fYear
2009
fDate
9-11 Dec. 2009
Firstpage
1
Lastpage
2
Abstract
In this paper the authors present a deterministic approach to compute the spatial origin of current noise spectral density in semiconductor devices. The numerical solution of it is based on the spherical harmonics expansion (SHE) of the Boltzmann transport equation (BTE) in the frequency domain with special initial and boundary conditions. The salient feature of this model is that: it utilizes the SHE that is a well established technique to solve the BTE; it combines analytical and numerical methods, in contrast with the Monte Carlo approach that employs ensemble averages of randomly generated events; the model formally relies on the solution of a time-dependent transient solution of the BTE with special initial and boundary condition that is solved in the frequency domain to directly compute the terminal current noise spectral density; and the terminal current noise is directly related to particle scattering inside the device, which is accounted for in the BTE, without the need to add Langevin noise terms to the calculations.
Keywords
Boltzmann equation; semiconductor device models; semiconductor device noise; transport processes; Boltzmann transport equation; frequency domain; particle scattering; semiclassical transport; semiconductor device current noise spatial origin; spherical harmonics expansion; terminal current noise spectral density; time-dependent transient solution; Boltzmann equation; Boundary conditions; DC generators; Frequency domain analysis; Monte Carlo methods; Noise generators; Particle scattering; Semiconductor device noise; Semiconductor devices; Transient analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Device Research Symposium, 2009. ISDRS '09. International
Conference_Location
College Park, MD
Print_ISBN
978-1-4244-6030-4
Electronic_ISBN
978-1-4244-6031-1
Type
conf
DOI
10.1109/ISDRS.2009.5378292
Filename
5378292
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