• DocumentCode
    3060205
  • Title

    A deterministic approach to the spatial origin of semiconductor device current noise for semiclassical transport

  • Author

    Noaman, B.A. ; Korman, C.E.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., George Washington Univ., Washington, DC, USA
  • fYear
    2009
  • fDate
    9-11 Dec. 2009
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    In this paper the authors present a deterministic approach to compute the spatial origin of current noise spectral density in semiconductor devices. The numerical solution of it is based on the spherical harmonics expansion (SHE) of the Boltzmann transport equation (BTE) in the frequency domain with special initial and boundary conditions. The salient feature of this model is that: it utilizes the SHE that is a well established technique to solve the BTE; it combines analytical and numerical methods, in contrast with the Monte Carlo approach that employs ensemble averages of randomly generated events; the model formally relies on the solution of a time-dependent transient solution of the BTE with special initial and boundary condition that is solved in the frequency domain to directly compute the terminal current noise spectral density; and the terminal current noise is directly related to particle scattering inside the device, which is accounted for in the BTE, without the need to add Langevin noise terms to the calculations.
  • Keywords
    Boltzmann equation; semiconductor device models; semiconductor device noise; transport processes; Boltzmann transport equation; frequency domain; particle scattering; semiclassical transport; semiconductor device current noise spatial origin; spherical harmonics expansion; terminal current noise spectral density; time-dependent transient solution; Boltzmann equation; Boundary conditions; DC generators; Frequency domain analysis; Monte Carlo methods; Noise generators; Particle scattering; Semiconductor device noise; Semiconductor devices; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Device Research Symposium, 2009. ISDRS '09. International
  • Conference_Location
    College Park, MD
  • Print_ISBN
    978-1-4244-6030-4
  • Electronic_ISBN
    978-1-4244-6031-1
  • Type

    conf

  • DOI
    10.1109/ISDRS.2009.5378292
  • Filename
    5378292