Title :
Hierarchical symmetry
Author :
Zabrodsky, H. ; Peleg, S. ; Avnir, D.
Author_Institution :
Hebrew Univ. of Jerusalem, Israel
fDate :
30 Aug-3 Sep 1992
Abstract :
The authors view symmetry as a continuous feature and dependent on resolution. Combining a continuous symmetry measure (CSM) with a multiresolution scheme, the authors present a method that hierarchically detects symmetric and almost symmetric patterns. Evaluation of symmetry at low frequencies guides the process to find the symmetry at higher frequencies
Keywords :
feature extraction; image recognition; almost symmetric patterns; continuous symmetry measure; feature extraction; hierarchical detection; image recognition; multiresolution scheme; Chemistry; Computer science; Face; Frequency; Humans; Layout; Reflection; Retina; Shape measurement; Spatial resolution;
Conference_Titel :
Pattern Recognition, 1992. Vol.III. Conference C: Image, Speech and Signal Analysis, Proceedings., 11th IAPR International Conference on
Conference_Location :
The Hague
Print_ISBN :
0-8186-2920-7
DOI :
10.1109/ICPR.1992.201915
