DocumentCode :
3060595
Title :
Iterative model-based Maximum Power Point Tracker for photovoltaic panels
Author :
Faifer, Marco ; Cristaldi, Loredana ; Toscani, Sergio ; Soulantiantork, Payam ; Rossi, Marco
Author_Institution :
DEIB, Politec. di Milano, Milan, Italy
fYear :
2015
fDate :
11-14 May 2015
Firstpage :
1273
Lastpage :
1278
Abstract :
Maximum Power Point Tracking (MPPT) techniques are used to maintain the photovoltaic (PV) panel operating point near its maximum power point (MPP). In general, the location of the MPP on the V-I plane is not known, but it can be reached, either through a-priori knowledge or by search algorithms. Lots of tracking algorithms have been presented in literature, and in the last years the focus has been moved on improving the performance during rapid changes without sacrificing the efficiency in steady state conditions. Model-based (MB) MPPT techniques guarantees excellent dynamic performance, since they locate MPP directly from a model of the PV panel in the present operating conditions, which are represented by solar radiation and temperature. In a recent paper the authors have presented a new approach to MPPT for PV panels which do not require a direct measurement of the solar radiation. In this work it will be shown how a simpler model can be employed to track MPP using an iterative technique. This method has been validated through experimentation.
Keywords :
iterative methods; maximum power point trackers; search problems; solar cell arrays; solar radiation; sunlight; MB MPPT techniques; PV panel; V-I plane; a-priori knowledge; iterative model; iterative technique; maximum power point tracker; maximum power point tracking; model-based MPPT techniques; photovoltaic panels; search algorithms; solar radiation; tracking algorithms; Current measurement; Estimation; Mathematical model; Maximum power point trackers; Solar radiation; Temperature measurement; Voltage measurement; Photovoltaic cells; energy efficiency; modeling; parameter estimation; solar energy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference (I2MTC), 2015 IEEE International
Conference_Location :
Pisa
Type :
conf
DOI :
10.1109/I2MTC.2015.7151456
Filename :
7151456
Link To Document :
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