Title :
A full-wave approach to the modeling of discontinuities of real conductors in planar lossy lines for MMIC applications
Author :
Farina, M. ; Rozzi, T.
Author_Institution :
Dipt. di Elettronica e Autom., Ancona Univ., Italy
Abstract :
We present a full-wave approach to the analysis of discontinuities of real conductors in planar lines, where conductor losses, as well as their finite thickness, are rigorously taken into account. The computational load is quite independent of the number of the dielectric layers composing the substrate, making the model particularly suitable to the analysis of discontinuities in MMIC circuits.
Keywords :
Galerkin method; MMIC; frequency-domain analysis; integral equations; losses; microstrip discontinuities; waveguide theory; MMIC applications; conductor losses; discontinuities modeling; finite conductor thickness; full-wave approach; planar lossy lines; real conductors; Circuit analysis computing; Conductors; Dielectric loss measurement; Dielectric substrates; H infinity control; Integral equations; Integrated circuit interconnections; Loss measurement; MMICs; Metallization;
Conference_Titel :
Microwave Symposium Digest, 1998 IEEE MTT-S International
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
0-7803-4471-5
DOI :
10.1109/MWSYM.1998.700672
