Fault location for teed circuits with mutually coupled lines and series capacitors

This paper investigates the problem of fault location in teed circuits. Previous work presented in C.Y. Evrenssoglu and A. Abur (Oct. 200), has successfully extended the discrete wavelet transform (DWT) based fault location technique of F.H. Magnago and A. Abur (Oct. 1998) to the case of teed circuits. In this paper, additional challenges introduced in the presence of MOV protected series capacitors and/or mutually coupled line sections in teed circuits are addressed. DWT based fault location procedures are developed and tested for these special cases. Fault signals simulated by ATP are used to validate the new fault location procedure under various scenarios.