Title :
Reverse Engineering Abstract Components for Model-Based Development and Verification of Embedded Software
Author :
Choi, Yunja ; Jang, Hoon
Author_Institution :
Sch. of Comput. Sci. & Eng., Coll. of IT Kyungpook Nat. Univ., Daegu, South Korea
Abstract :
Model-driven development (MDD) and verification approaches are highly desirable in the development of (safety-critical) embedded systems, since they help to identify functional or non-functional issues from the early development stage when verification complexity is relatively lower than that of the implemented systems. Nevertheless, MDD approaches have not been widely adopted in practice mainly due to the difficulty and high initial cost of switching the development paradigm from code-centric to model-driven. This work presents a systematic method for reverse engineering abstract models from embedded codes using the notion of abstract components which act as independent units of development, validation, and verification. The recursive reverse engineering process constructs high-level abstract components from low-level ones using synchronized abstraction and projection abstraction, defined w.r.t. the information on port dependency and port bindings. This approach is demonstrated with reverse-engineered TinyOS, where each abstract component is validated and verified using model simulation and model checking.
Keywords :
embedded systems; program verification; reverse engineering; safety-critical software; MDD; TinyOS; embedded software verification; high-level abstract component; model checking; model simulation; model-based development; projection abstraction; reverse engineering; safety-critical embedded system; synchronized abstraction; Embedded systems; Manuals; Radiation detectors; Reverse engineering; Switches; Synchronization; Systematics; Reverse-engineering; abstraction; component;
Conference_Titel :
High-Assurance Systems Engineering (HASE), 2010 IEEE 12th International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-9091-2
Electronic_ISBN :
1530-2059
DOI :
10.1109/HASE.2010.20