• DocumentCode
    3061948
  • Title

    COMeT: Continuous Online Memory Test

  • Author

    Rahman, Musfiq ; Childers, Bruce R. ; Cho, Sangyeun

  • Author_Institution
    Comput. Sci. Dept., Univ. of Pittsburgh, Pittsburgh, PA, USA
  • fYear
    2011
  • fDate
    12-14 Dec. 2011
  • Firstpage
    109
  • Lastpage
    118
  • Abstract
    Today´s computers have gigabytes of main memory due to improved DRAM density. As density increases, smaller bit cells become more susceptible to errors. With an increase in error susceptibility, the need for memory resiliency also increases. Self-testing of memory health can proactively check for errors to improve resiliency. This paper describes a software-only self test to continuously test memory. We present the challenges and design for an approach, called Continuous Online Memory Testing (COMeT), that targets chip multiprocessors. COMeT tests memory health simultaneously with application execution in anticipation of allocation requests. The approach guarantees that memory is tested within a fixed time interval to limit exposure to lurking errors. We developed and evaluated an implementation of COMeT. On the SPEC CPU2006 benchmarks, COMeT has a low 4% average performance overhead. When emulated errors were injected into physical memory, applications executed 1.13× to 4.41× longer with COMeT than without it.
  • Keywords
    DRAM chips; multiprocessing systems; program testing; COMeT; DRAM density; SPEC CPU2006 benchmarks; allocation requests; chip multiprocessor; continuous online memory testing; error susceptibility; lurking error; memory health self-testing; memory resiliency; performance overhead; software only self-testing; Instruction sets; Kernel; Linux; Memory management; Random access memory; Resource management; Testing; Self testing; errors; memory; resilience;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Dependable Computing (PRDC), 2011 IEEE 17th Pacific Rim International Symposium on
  • Conference_Location
    Pasadena, CA
  • Print_ISBN
    978-1-4577-2005-5
  • Electronic_ISBN
    978-0-7695-4590-5
  • Type

    conf

  • DOI
    10.1109/PRDC.2011.22
  • Filename
    6133072