• DocumentCode
    3062029
  • Title

    Numerical Defect Correction as an Algorithm-Based Fault Tolerance Technique for Iterative Solvers

  • Author

    Oboril, Fabian ; Tahoori, Mehdi B. ; Heuveline, Vincent ; Lukarski, Dimitar ; Weiss, Jan-Philipp

  • Author_Institution
    Dept. of Dependable Nano-Comput., Karlsruhe Inst. of Technol. (KIT), Karlsruhe, Germany
  • fYear
    2011
  • fDate
    12-14 Dec. 2011
  • Firstpage
    144
  • Lastpage
    153
  • Abstract
    As hardware devices like processor cores and memory sub-systems based on nano-scale technology nodes become more unreliable, the need for fault tolerant numerical computing engines, as used in many critical applications with long computation/mission times, is becoming pronounced. In this paper, we present an Algorithm-based Fault Tolerance (ABFT) scheme for an iterative linear solver engine based on the Conjugated Gradient method (CG) by taking the advantage of numerical defect correction. This method is "pay as you go", meaning that there is practically only a runtime overhead if errors occur and a correction is performed. Our experimental comparison with software-based Triple Modular Redundancy (TMR) clearly shows the runtime benefit of the proposed approach, good fault tolerance and no occurrence of silent data corruption.
  • Keywords
    conjugate gradient methods; hardware-software codesign; iterative methods; program testing; redundancy; software fault tolerance; software prototyping; TMR; algorithm based fault tolerance; conjugate gradient method; iterative linear solver; nanoscale technology; numerical computing engines; numerical defect correction; software testing; triple modular redundancy; Checkpointing; Convergence; Fault tolerance; Fault tolerant systems; Hardware; Runtime; Vectors; algorithm-based fault tolerance; checkpointing; conjugated gradient; defect correction; triple modular redundancy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Dependable Computing (PRDC), 2011 IEEE 17th Pacific Rim International Symposium on
  • Conference_Location
    Pasadena, CA
  • Print_ISBN
    978-1-4577-2005-5
  • Electronic_ISBN
    978-0-7695-4590-5
  • Type

    conf

  • DOI
    10.1109/PRDC.2011.26
  • Filename
    6133076