Title :
An improved algorithm for thinning binary digital patterns
Author :
Nagendraprasad, M.V. ; Wang, Patrick S P ; Gupta, Amar
Author_Institution :
Intelligent Eng. Syst. Lab., MIT, Cambridge, MA, USA
fDate :
30 Aug-3 Sep 1992
Abstract :
A number of image processing and pattern recognition applications demand that a raw digitized binary pattern array be normalized, so that the constituent components of that array are of uniform thickness. The thinning process reduces such components to a thickness of one pixel, or sometimes a few pixels. This paper describes a strategy for farther enhancing the operational speed of one of the fastest parallel algorithms proposed in the literature
Keywords :
computer vision; image processing; image recognition; parallel algorithms; binary digital patterns; image processing; parallel algorithms; pattern recognition; thinning process; Application software; Clocks; Educational institutions; Image processing; Image recognition; Parallel algorithms; Pattern recognition; Pixel; Testing;
Conference_Titel :
Pattern Recognition, 1992. Vol.III. Conference C: Image, Speech and Signal Analysis, Proceedings., 11th IAPR International Conference on
Conference_Location :
The Hague
Print_ISBN :
0-8186-2920-7
DOI :
10.1109/ICPR.1992.202005