• DocumentCode
    3063274
  • Title

    A new denoising method for dynamic contrast-enhanced MRI

  • Author

    Gal, Yaniv ; Mehnert, Andrew ; Bradley, Andrew ; McMahon, Kerry ; Kennedy, Dominic ; Crozier, Stuart

  • Author_Institution
    School of Information Technology and Electrical Engineering, The University of Queensland, Brisbane, Qld, Australia
  • fYear
    2008
  • fDate
    20-25 Aug. 2008
  • Firstpage
    847
  • Lastpage
    850
  • Abstract
    This paper presents a new algorithm for denoising dynamic contrast-enhanced (DCE) MR images. The algorithm is called Dynamic Non-Local Means and is a novel variation on the Non-Local Means (NL-Means) algorithm. It exploits the redundancy of information in the DCE-MRI sequence of images. An evaluation of the performance of the algorithm relative to six other denoising algorithms—Gaussian filtering, the original NL-Means algorithm, bilateral filtering, anisotropic diffusion filtering, the wavelets adaptive multiscale products threshold method, and the traditional wavelet thresholding method—is also presented. The evaluation was performed by two groups of expert observers—18 signal/image processing experts, and 9 clinicians (8 radiographers and 1 radiologist)—using real DCE-MRI data. The results of the evaluation provide evidence, at the α=0.05 level of significance, that both groups of observers deem the DNLM algorithm to perform visually better than all of the other algorithms.
  • Keywords
    Adaptive filters; Anisotropic magnetoresistance; Filtering algorithms; Heuristic algorithms; Image processing; Magnetic resonance imaging; Noise reduction; Performance evaluation; Radiography; Signal processing; Algorithms; Artifacts; Contrast Media; Image Enhancement; Image Interpretation, Computer-Assisted; Magnetic Resonance Imaging; Reproducibility of Results; Sensitivity and Specificity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2008. EMBS 2008. 30th Annual International Conference of the IEEE
  • Conference_Location
    Vancouver, BC
  • ISSN
    1557-170X
  • Print_ISBN
    978-1-4244-1814-5
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2008.4649286
  • Filename
    4649286