DocumentCode :
3064132
Title :
Characterization of GaInP avalanche transit time device in millimeter-wave frequencies
Author :
Meng, C.C. ; Liao, G.R.
Author_Institution :
Dept. of Electr. Eng., Nat. Chung-Hsing Univ., Taichung, Taiwan
Volume :
3
fYear :
1998
fDate :
7-12 June 1998
Firstpage :
1715
Abstract :
GaInP material has high breakdown electrical fields and thus is suitable to avalanche transit time device application. Millimeter-wave GaInP IMPATT devices at operating temperature (500 K) are analyzed by a large signal model in this paper. The simulation confirms that GaInP IMPATT device has the power density advantage when compared to conventional GaAs and Si IMPATT devices. The improvement in power density is about factor of 4 at 100 GHz. Moreover, GaInP IMPATT devices are easy to incorporate into GaAs millimeter-wave monolithic integrated circuit technology because of the lattice-match and high etching selectivity between GaInP and GaAs materials.
Keywords :
III-V semiconductors; IMPATT diodes; gallium compounds; indium compounds; millimetre wave diodes; power semiconductor diodes; semiconductor device models; 100 GHz; 500 K; GaInP; GaInP avalanche transit time device; breakdown electrical field; etching selectivity; large signal model; lattice match; millimeter-wave IMPATT device; power density; simulation; Avalanche breakdown; Circuit simulation; Electric breakdown; Etching; Gallium arsenide; Integrated circuit technology; MIMICs; Millimeter wave technology; Signal analysis; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 1998 IEEE MTT-S International
Conference_Location :
Baltimore, MD, USA
ISSN :
0149-645X
Print_ISBN :
0-7803-4471-5
Type :
conf
DOI :
10.1109/MWSYM.1998.700711
Filename :
700711
Link To Document :
بازگشت