DocumentCode
3064193
Title
Exploring long-term behavior of analog to digital converters
Author
Jiang, Fangliang
Author_Institution
Beijing Orient Inst. of Test & Meas., CAST, Beijing, China
fYear
2004
fDate
24-27 Aug. 2004
Firstpage
1
Lastpage
4
Abstract
The accuracy of analog to digital converter (ADC), differential nonlinearity (DNL) and integral nonlinearity (INL), was continuously measured for one year. This paper presents the measurement experiment, explains the method of data analysis, and discusses the results. The long-term stability and repeatability turns out to be limited mainly by temperature drift and random errors.
Keywords
analogue-digital conversion; circuit stability; nonlinear network analysis; ADC accuracy; DNL; INL; analog to digital converters; differential nonlinearity; integral nonlinearity; long-term drift; long-term repeatability; long-term stability; random errors; temperature drift; Analog-digital conversion; Clocks; Data analysis; Histograms; Linearity; Metrology; Signal generators; Stability; System testing; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Radio Science Conference, 2004. Proceedings. 2004 Asia-Pacific
Print_ISBN
0-7803-8404-0
Type
conf
DOI
10.1109/APRASC.2004.1422382
Filename
1422382
Link To Document