DocumentCode
3064213
Title
Bayes inference for reliability of HV insulation systems in the presence of switching voltage surges using a Weibull stress-strength model
Author
Chiodo, E. ; Fabiani, D. ; Mazzanti, G.
Author_Institution
Dept. of Electr. Eng., Napoli Univ., Italy
Volume
3
fYear
2003
fDate
23-26 June 2003
Abstract
This work shows a Bayesian approach to evaluate the effect of switching overvoltages on HV insulation reliability. Indeed, HV insulation is often designed to withstand rated temperature and nominal (AC or DC) voltage but not voltage surges, whose amplitude can largely exceed rated voltage even in the case of switching overvoltages. Since both voltage surges and insulation electric strength (affected by aging) have stochastic nature, reliability evaluation involves the use of the relevant probability distributions, whose parameters are generally known with large uncertainty. Thus, the methodology for reliability assessment here presented, based on Bayesian estimation, is a useful tool in the case of HV insulation subjected to switching voltage surges. Under proper assumptions, among which a particular Weibull stress-strength model - leading to a loglogistic distribution for lifetime the proposed method enables the analytical determination of prior and posterior distributions of reliability and other related parameters, such as given percentiles of service life, and their Bayes point and interval estimates. The analytical feasibility and simplicity of the procedure are illustrated in the paper by means of a numerical application, and the efficiency of estimates is shown through extensive Monte Carlo simulations. The method is applied to HVAC cable insulation.
Keywords
Bayes methods; Monte Carlo methods; Weibull distribution; overvoltage; power cable insulation; power transmission reliability; Bayesian estimation; HV insulation systems reliability; HVAC cable insulation; Monte Carlo simulations; Weibull stress-strength model; insulation electric strength; loglogistic distribution; probability distributions; reliability assessment; switching voltage surges; Aging; Bayesian methods; Dielectrics and electrical insulation; Life estimation; Probability distribution; Stochastic processes; Surges; Temperature; Uncertainty; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Tech Conference Proceedings, 2003 IEEE Bologna
Print_ISBN
0-7803-7967-5
Type
conf
DOI
10.1109/PTC.2003.1304524
Filename
1304524
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