Title :
A fully automated high-accuracy RF/IF test system for millimeter- and submillimeter-wave mixers
Author :
Dengler, R.J. ; Hanpachern, A. ; Siegel, P.H.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Abstract :
An automated RF/IF test system for complete, accurate measurement of millimeter and submillimeter-wave mixer performance is described. Improved ability to measure mixers with high IF output impedance over a 1-18 GHz bandwidth has been achieved through the use of an automatic tuner and swept scalar reflection measurement. An accurate means of measuring mixer sideband response over a wide IF range is also described.
Keywords :
automatic test equipment; millimetre wave measurement; millimetre wave mixers; submillimetre wave measurement; submillimetre wave mixers; swept-frequency reflectometry; 1 to 18 GHz; automated RF/IF test system; automatic tuner; millimeter-wave mixer; sideband response; submillimeter-wave mixer; swept scalar reflection measurement; Automatic testing; Bandwidth; Impedance measurement; Isolators; Noise measurement; Power amplifiers; Radio frequency; Submillimeter wave technology; Switches; System testing;
Conference_Titel :
Microwave Symposium Digest, 1998 IEEE MTT-S International
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
0-7803-4471-5
DOI :
10.1109/MWSYM.1998.700712
