• DocumentCode
    3064468
  • Title

    Study on scattering of Gaussian beam by two dimensional dielectric rough surfaces

  • Author

    Hui, Chen ; Zhen-Sen, Wu

  • Author_Institution
    Sch. of Sci., Xidian Univ., Xi´´an, China
  • fYear
    2004
  • fDate
    24-27 Aug. 2004
  • Firstpage
    31
  • Lastpage
    34
  • Abstract
    The modification of the Kirchoff approximation theory for rough surface scattering by an incident Gaussian beam instead of a plane wave is developed based on conventional Kirchoff scattering theory and a plane wave spectrum expansion method. A close form for the normalized coherent scattering cross section is derived when the linear dimension of a rough surface patch is twice as large as the beam size. It is shown that provided the incident Gaussian beam size is much larger compared with the surface height correlation length, the normalized scattering cross section is the same as for an incident plane wave.
  • Keywords
    approximation theory; dielectric bodies; electromagnetic wave scattering; rough surfaces; Gaussian beam scattering; Kirchoff approximation theory; Kirchoff scattering theory; close form; normalized coherent scattering cross section; plane wave spectrum expansion; rough surface scattering; surface height correlation length; two dimensional dielectric rough surfaces; Dielectrics; Gaussian processes; Geometry; Kirchhoff´s Law; Light scattering; Lighting; Polarization; Rough surfaces; Surface roughness; Surface waves;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio Science Conference, 2004. Proceedings. 2004 Asia-Pacific
  • Print_ISBN
    0-7803-8404-0
  • Type

    conf

  • DOI
    10.1109/APRASC.2004.1422391
  • Filename
    1422391