DocumentCode
3064468
Title
Study on scattering of Gaussian beam by two dimensional dielectric rough surfaces
Author
Hui, Chen ; Zhen-Sen, Wu
Author_Institution
Sch. of Sci., Xidian Univ., Xi´´an, China
fYear
2004
fDate
24-27 Aug. 2004
Firstpage
31
Lastpage
34
Abstract
The modification of the Kirchoff approximation theory for rough surface scattering by an incident Gaussian beam instead of a plane wave is developed based on conventional Kirchoff scattering theory and a plane wave spectrum expansion method. A close form for the normalized coherent scattering cross section is derived when the linear dimension of a rough surface patch is twice as large as the beam size. It is shown that provided the incident Gaussian beam size is much larger compared with the surface height correlation length, the normalized scattering cross section is the same as for an incident plane wave.
Keywords
approximation theory; dielectric bodies; electromagnetic wave scattering; rough surfaces; Gaussian beam scattering; Kirchoff approximation theory; Kirchoff scattering theory; close form; normalized coherent scattering cross section; plane wave spectrum expansion; rough surface scattering; surface height correlation length; two dimensional dielectric rough surfaces; Dielectrics; Gaussian processes; Geometry; Kirchhoff´s Law; Light scattering; Lighting; Polarization; Rough surfaces; Surface roughness; Surface waves;
fLanguage
English
Publisher
ieee
Conference_Titel
Radio Science Conference, 2004. Proceedings. 2004 Asia-Pacific
Print_ISBN
0-7803-8404-0
Type
conf
DOI
10.1109/APRASC.2004.1422391
Filename
1422391
Link To Document