DocumentCode :
3064468
Title :
Study on scattering of Gaussian beam by two dimensional dielectric rough surfaces
Author :
Hui, Chen ; Zhen-Sen, Wu
Author_Institution :
Sch. of Sci., Xidian Univ., Xi´´an, China
fYear :
2004
fDate :
24-27 Aug. 2004
Firstpage :
31
Lastpage :
34
Abstract :
The modification of the Kirchoff approximation theory for rough surface scattering by an incident Gaussian beam instead of a plane wave is developed based on conventional Kirchoff scattering theory and a plane wave spectrum expansion method. A close form for the normalized coherent scattering cross section is derived when the linear dimension of a rough surface patch is twice as large as the beam size. It is shown that provided the incident Gaussian beam size is much larger compared with the surface height correlation length, the normalized scattering cross section is the same as for an incident plane wave.
Keywords :
approximation theory; dielectric bodies; electromagnetic wave scattering; rough surfaces; Gaussian beam scattering; Kirchoff approximation theory; Kirchoff scattering theory; close form; normalized coherent scattering cross section; plane wave spectrum expansion; rough surface scattering; surface height correlation length; two dimensional dielectric rough surfaces; Dielectrics; Gaussian processes; Geometry; Kirchhoff´s Law; Light scattering; Lighting; Polarization; Rough surfaces; Surface roughness; Surface waves;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radio Science Conference, 2004. Proceedings. 2004 Asia-Pacific
Print_ISBN :
0-7803-8404-0
Type :
conf
DOI :
10.1109/APRASC.2004.1422391
Filename :
1422391
Link To Document :
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