Title :
Ultimate Quantum Limits In The Measurement Of Very Small Displacements in Optical Images
Author :
Fabre, Claude ; Maitre, A. ; Vaupel, M.
Author_Institution :
Laboratoire Kastler Brossel
Keywords :
Displacement measurement; Numerical simulation; Silicon carbide;
Conference_Titel :
Quantum Electronics Conference, 1998. 1998 EQEC. European
Conference_Location :
Glasgow, UK
Print_ISBN :
0-7803-4231-3
DOI :
10.1109/EQEC.1998.715166
