Title :
The algorithms of inserting boundary-scan circuit automatically
Author :
Zhu, GuoHun ; Yan, Xuelong ; Zhou, Ya ; Guo, YueRen
Author_Institution :
Guilin Inst. of Electron. Technol., China
Abstract :
Boundary Scan is one of the most popular technique of DFT (Design For Testability) today. Although some tools can automatically insert and verify boundary-scan circuitry, but they are not easily used. So we designed a set of tools. The tool set can process the RTL and behavioral VHDL files, distinguish the source files with boundary-scan circuitry, generate VHDL with IEEE 1149.1 compliant boundary scan circuitry. This paper describes the main algorithms of boundary-scan in detail. First the tools scan the VHDL source code and obtain the pin and the pin types. Next they consider the bidirectional signal, a 3-state signal which controlled pins BSCs (boundary-scan calls) configuration and process the clock pin. Finally, the corresponding VHDL and BSDL files and test bench files with IEEE defined basic instructions, are generated
Keywords :
boundary scan testing; design for testability; hardware description languages; integrated circuit design; integrated circuit testing; logic CAD; logic testing; 3-state signal; BSDL files generation; CAD; DFT; IEEE 1149.1 compliant BS circuitry; RTL files; VHDL files generation; automatic insertion; behavioral VHDL files; bidirectional signal; boundary-scan calls; boundary-scan circuitry; design for testability; pin types; source files; test bench files; Algorithm design and analysis; Circuits; Data models; Indium phosphide; Information analysis; Libraries; Signal analysis; Signal design; Signal generators; Signal processing;
Conference_Titel :
Solid-State and Integrated Circuit Technology, 1998. Proceedings. 1998 5th International Conference on
Conference_Location :
Beijing
Print_ISBN :
0-7803-4306-9
DOI :
10.1109/ICSICT.1998.785938