Easily testable VLSI design intelligent selection and insertion system DISIS

Author

Xinguang, Peng ; Fenge, Bai ; Zhaoguang, Meng

Author_Institution

Dept. of Comput. Sci. & Eng., Taiyuan Univ. of Technol., China

fYear

1998

fDate

1998

Firstpage

536

Lastpage

539

Abstract

DISIS is a knowledge based intelligent system that advises the VLSI designers on selecting and inserting the best design for testability (DFT) for a particular VLSI circuit to satisfy a set of parameter requirements and design goals. The DISIS system is different from the previous approaches in three main aspects. The DFT techniques are inserted only to the critical ports identified by testability analysis. The multiple description and a new cost evaluation function are introduced to the DISIS system

Keywords

VLSI; circuit CAD; design for testability; high level synthesis; integrated circuit design; integrated circuit testing; knowledge based systems; DFT insertion; DISIS; VLSI design; cost evaluation function; critical ports identification; design for testability; knowledge based intelligent system; multiple description function; testability analysis; Circuit testing; Controllability; Cost function; Design for testability; Hardware; Intelligent systems; Observability; Shift registers; System testing; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State and Integrated Circuit Technology, 1998. Proceedings. 1998 5th International Conference on

Conference_Location

Beijing

Print_ISBN

0-7803-4306-9

Type

conf

DOI

10.1109/ICSICT.1998.785940

Filename

785940