Title :
Easily testable VLSI design intelligent selection and insertion system DISIS
Author :
Xinguang, Peng ; Fenge, Bai ; Zhaoguang, Meng
Author_Institution :
Dept. of Comput. Sci. & Eng., Taiyuan Univ. of Technol., China
Abstract :
DISIS is a knowledge based intelligent system that advises the VLSI designers on selecting and inserting the best design for testability (DFT) for a particular VLSI circuit to satisfy a set of parameter requirements and design goals. The DISIS system is different from the previous approaches in three main aspects. The DFT techniques are inserted only to the critical ports identified by testability analysis. The multiple description and a new cost evaluation function are introduced to the DISIS system
Keywords :
VLSI; circuit CAD; design for testability; high level synthesis; integrated circuit design; integrated circuit testing; knowledge based systems; DFT insertion; DISIS; VLSI design; cost evaluation function; critical ports identification; design for testability; knowledge based intelligent system; multiple description function; testability analysis; Circuit testing; Controllability; Cost function; Design for testability; Hardware; Intelligent systems; Observability; Shift registers; System testing; Very large scale integration;
Conference_Titel :
Solid-State and Integrated Circuit Technology, 1998. Proceedings. 1998 5th International Conference on
Conference_Location :
Beijing
Print_ISBN :
0-7803-4306-9
DOI :
10.1109/ICSICT.1998.785940
