Title :
A method for semiautomatic tracing and morphological measuring of neurite outgrowth from DIC sequences
Author :
Fanti, Zian ; De-Miguel, Francisco F. ; Martinez-Perez, M. Elena
Author_Institution :
Department of Computer Science, Instituto de Investigaciones en Matemáticas Aplicadas y en Sistemas, Universidad Nacional Autónoma de México, Apartado Postal 20-726, México 04510 D.F., México
Abstract :
We present a method for semi-automatic tracing and measuring of neurite outgrowth from time-lapse sequences of digital Nomarski micrographs. The algorithm is based on neurite ridge extraction and characterization from a single frame, followed by an automatic neurite tracking and measurement along the image sequence. Our method was tested with two sequences one containing 29 and other with 77 frames taken at intervals of 2 min. Our method rendered comparable length measurements but better time performance than measurements made by use of certain public software.
Keywords :
Image analysis; Image sequence analysis; Length measurement; Lighting; Neurons; Nonlinear optics; Optical filters; Optical microscopy; Pixel; Testing; Algorithms; Animals; Artificial Intelligence; Cell Enlargement; Cells, Cultured; Humans; Image Enhancement; Image Interpretation, Computer-Assisted; Microscopy, Phase-Contrast; Microscopy, Video; Neurites; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity; Subtraction Technique;
Conference_Titel :
Engineering in Medicine and Biology Society, 2008. EMBS 2008. 30th Annual International Conference of the IEEE
Conference_Location :
Vancouver, BC
Print_ISBN :
978-1-4244-1814-5
Electronic_ISBN :
1557-170X
DOI :
10.1109/IEMBS.2008.4649377
