A method for semiautomatic tracing and morphological measuring of neurite outgrowth from DIC sequences

Author

Fanti, Zian ; De-Miguel, Francisco F. ; Martinez-Perez, M. Elena

Author_Institution

Department of Computer Science, Instituto de Investigaciones en MatemÃ¡ticas Aplicadas y en Sistemas, Universidad Nacional AutÃ³noma de MÃ©xico, Apartado Postal 20-726, MÃ©xico 04510 D.F., MÃ©xico

fYear

2008

fDate

20-25 Aug. 2008

Firstpage

1196

Lastpage

1199

Abstract

We present a method for semi-automatic tracing and measuring of neurite outgrowth from time-lapse sequences of digital Nomarski micrographs. The algorithm is based on neurite ridge extraction and characterization from a single frame, followed by an automatic neurite tracking and measurement along the image sequence. Our method was tested with two sequences one containing 29 and other with 77 frames taken at intervals of 2 min. Our method rendered comparable length measurements but better time performance than measurements made by use of certain public software.

Keywords

Image analysis; Image sequence analysis; Length measurement; Lighting; Neurons; Nonlinear optics; Optical filters; Optical microscopy; Pixel; Testing; Algorithms; Animals; Artificial Intelligence; Cell Enlargement; Cells, Cultured; Humans; Image Enhancement; Image Interpretation, Computer-Assisted; Microscopy, Phase-Contrast; Microscopy, Video; Neurites; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity; Subtraction Technique;

fLanguage

English

Publisher

ieee

Conference_Titel

Engineering in Medicine and Biology Society, 2008. EMBS 2008. 30th Annual International Conference of the IEEE

Conference_Location

Vancouver, BC

ISSN

1557-170X

Print_ISBN

978-1-4244-1814-5

Electronic_ISBN

1557-170X

Type

conf

DOI

10.1109/IEMBS.2008.4649377

Filename

4649377