Title :
Combination of H∞ and PI control for an electromagnetically levitated vibration isolation system
Author :
Watanabe, Katsuhide ; Hara, Shinji ; Kanemitsu, Yoichi ; Haga, Takahide ; Yano, Kenichi ; Mizuno, Takayuki ; Katamura, Ryuta
Author_Institution :
Ebara Corp., Fujisawa, Japan
Abstract :
A control system, featuring a combination of H∞ and PI control methods for control in the vertical direction, of an electromagnetically levitated vibration isolation system was designed. Experiments were carried out to verify this system´s noncontact levitation and microvibration control performance. The main components of this system are a vibration isolation table with built-in acceleration sensors for detecting microvibration, electromagnetic actuators with built-in electromagnets and displacement sensors, and a digital controller with the DSP. An H∞ controller was designed to be used for an augmented system which included a PI-type controller of relative displacement feedback. This H∞ controller enabled effective, noncontact stable levitation as well as vibration isolation. Experimental results by a test apparatus revealed that the designed controller yielded a 90% in vibration transmissibility in vertical-direction
Keywords :
H∞ control; acceleration measurement; digital control; digital signal processing chips; electric actuators; feedback; magnetic levitation; sensors; two-term control; vibration control; DSP; H∞ control; PI control; built-in acceleration sensors; built-in electromagnets; digital controller; displacement sensors; electromagnetic actuators; electromagnetically levitated vibration isolation system; microvibration control performance; noncontact levitation; noncontact stable levitation; relative displacement feedback; vertical vibration transmissibility; vibration isolation table; Acceleration; Actuators; Control systems; Digital control; Displacement control; Electromagnets; Levitation; Pi control; Sensor systems; Vibration control;
Conference_Titel :
Decision and Control, 1996., Proceedings of the 35th IEEE Conference on
Conference_Location :
Kobe
Print_ISBN :
0-7803-3590-2
DOI :
10.1109/CDC.1996.572661