Title :
Comparison Between Six-Port Ana Using Diode Detectors and Other Measurement Systems
Author :
Bergeault, E. ; Huyart, B. ; Geneves, G. ; Jallet, L.
Author_Institution :
Laboratoire Central des Industries Electriques, France
Keywords :
Attenuation measurement; Attenuators; Diodes; Dynamic range; Envelope detectors; Frequency measurement; Microwave measurements; Phase measurement; Reflection; System testing;
Conference_Titel :
Microwave Conference, 1992. APMC 92. 1992 Asia-Pacific
Conference_Location :
Adelaide, South Australia
Print_ISBN :
0-7803-0549-3
DOI :
10.1109/APMC.1992.672348