Bridging the gap between design and testing of analog integrated circuits

Author

Soenen, E. ; VanPeteghem, P. ; Liu, H. ; Narayan, S. ; Cummings, J.

Author_Institution

Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA

fYear

1990

fDate

13-15 Feb 1990

Firstpage

232

Lastpage

235

Abstract

It is noted that an important problem associated with analog and mixed analog/digital VLSI design has been the lack of a systematic approach to the design and testing of such integrated systems. The authors describe a computer environment that brings the different design aspects closely together. It has been used successfully to analyze the performance of high-speed flash analog/digital converters. Interaction among simulations, CAD (computer-aided design) tools, measurements, and testing is provided for in this approach

Keywords

VLSI; analogue-digital conversion; automatic testing; circuit CAD; digital simulation; integrated circuit testing; linear integrated circuits; CAD; IC testing; VLSI; analog integrated circuits; computer environment; high-speed flash analog/digital converters; linear IC; mixed analog/digital VLSI design; simulations; Analog integrated circuits; Circuit simulation; Circuit testing; Data processing; Instruments; Integrated circuit testing; Local area networks; Predictive models; System testing; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 1990. IMTC-90. Conference Record., 7th IEEE

Conference_Location

San Jose, CA

Type

conf

DOI

10.1109/IMTC.1990.66005

Filename

66005