DocumentCode :
3065699
Title :
The study on the optical properties of GaN detector on the 6H-SiC substrates
Author :
Zang, L. ; Shen, B. ; Yang, K. ; Chen, P. ; Zhang, R. ; Chen, Z.Z. ; Zhou, Y.G. ; Zheng, Y.D.
Author_Institution :
Dept. of Phys., Nanjing Univ., China
fYear :
1998
fDate :
1998
Firstpage :
622
Lastpage :
624
Abstract :
We have studied the optical properties of the ultraviolet detector based on the GaN epilayer grown on 6H-SiC substrate by metalorganic chemical vapor deposition. We obtained the detectable energy span of the device up to ultraviolet by photocurrent measurement. The spectral responsivity remained nearly constant for wavelengths from 250 to 365 nm and dropped by three orders of magnitude within 10 nm of the band edge (by 380 nm). The detector was measured to have a responsivity of 133 A/W at a wavelength of 360 nm under a 5-V bias, and the voltage-dependent responsivity was performed. Furthermore, an easy method was developed to determine the response time and the relationship between response time and bias was obtained
Keywords :
III-V semiconductors; gallium compounds; photoconductivity; photodetectors; semiconductor device measurement; semiconductor epitaxial layers; silicon compounds; ultraviolet detectors; wide band gap semiconductors; 250 to 380 nm; 5 V; 6H-SiC substrates; GaN detector; GaN epilayer; GaN-SiC; SiC; bias; detectable energy span; metalorganic chemical vapor deposition; optical properties; photocurrent measurement; response time; responsivity; spectral responsivity; ultraviolet detector; voltage-dependent responsivity; Delay; Detectors; Electrical resistance measurement; Gallium nitride; Optical surface waves; Photoconductivity; Photodetectors; Substrates; Voltage; Wavelength measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated Circuit Technology, 1998. Proceedings. 1998 5th International Conference on
Conference_Location :
Beijing
Print_ISBN :
0-7803-4306-9
Type :
conf
DOI :
10.1109/ICSICT.1998.785966
Filename :
785966
Link To Document :
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