DocumentCode :
3065778
Title :
Highly efficient and ultra-fast visible-blind ultra-violet detectors
Author :
Sou, I.K. ; Ma, Z.H. ; Wong, K.S. ; Yang, Z. ; Wong, G.K.L.
Author_Institution :
Dept. of Phys., Hong Kong Univ. of Sci. & Technol., Kowloon, Hong Kong
fYear :
1998
fDate :
1998
Firstpage :
633
Lastpage :
636
Abstract :
A two-step molecular beam epitaxy growth approach, which enjoys the advantage of being wet-chemical-etching free, was developed to fabricate a ZnSTe-based Schottky barrier photovoltaic ultra-violet (UV) detector array on GaP (100). Visible blind and UV sensitive response were achieved with peak UV responsivity of 1.23 A/W and 1.2×106 V/W at 320 nm. Through the measurement of the photovoltage output as a function of incident photon power, the built-in potential of the detector was determined to be 1.7 V. Temporal response measurement of the device shows that the photocurrent decays with a time constant as fast as 1.2 ns, limited apparently by the RC time constant of the detector structure
Keywords :
II-VI semiconductors; Schottky barriers; arrays; high-speed optical techniques; molecular beam epitaxial growth; photoconductivity; semiconductor device measurement; semiconductor growth; ultraviolet detectors; zinc compounds; 1.2 ns; 1.7 V; 320 nm; GaP (100); RC time constant; UV responsivity; ZnSTe; ZnSTe-based Schottky barrier photovoltaic ultra-violet detector array; built-in potential; efficient ultra-fast visible-blind ultra-violet detectors; photocurrent decay; photovoltage output; temporal response measurement; time constant; two-step molecular beam epitaxy growth; wet-chemical-etching free process; Detectors; Extraterrestrial measurements; Molecular beam epitaxial growth; Ohmic contacts; Photoconductivity; Photonic band gap; Pollution measurement; Power measurement; Tellurium; Time measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated Circuit Technology, 1998. Proceedings. 1998 5th International Conference on
Conference_Location :
Beijing
Print_ISBN :
0-7803-4306-9
Type :
conf
DOI :
10.1109/ICSICT.1998.785969
Filename :
785969
Link To Document :
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