• DocumentCode
    3065778
  • Title

    Highly efficient and ultra-fast visible-blind ultra-violet detectors

  • Author

    Sou, I.K. ; Ma, Z.H. ; Wong, K.S. ; Yang, Z. ; Wong, G.K.L.

  • Author_Institution
    Dept. of Phys., Hong Kong Univ. of Sci. & Technol., Kowloon, Hong Kong
  • fYear
    1998
  • fDate
    1998
  • Firstpage
    633
  • Lastpage
    636
  • Abstract
    A two-step molecular beam epitaxy growth approach, which enjoys the advantage of being wet-chemical-etching free, was developed to fabricate a ZnSTe-based Schottky barrier photovoltaic ultra-violet (UV) detector array on GaP (100). Visible blind and UV sensitive response were achieved with peak UV responsivity of 1.23 A/W and 1.2×106 V/W at 320 nm. Through the measurement of the photovoltage output as a function of incident photon power, the built-in potential of the detector was determined to be 1.7 V. Temporal response measurement of the device shows that the photocurrent decays with a time constant as fast as 1.2 ns, limited apparently by the RC time constant of the detector structure
  • Keywords
    II-VI semiconductors; Schottky barriers; arrays; high-speed optical techniques; molecular beam epitaxial growth; photoconductivity; semiconductor device measurement; semiconductor growth; ultraviolet detectors; zinc compounds; 1.2 ns; 1.7 V; 320 nm; GaP (100); RC time constant; UV responsivity; ZnSTe; ZnSTe-based Schottky barrier photovoltaic ultra-violet detector array; built-in potential; efficient ultra-fast visible-blind ultra-violet detectors; photocurrent decay; photovoltage output; temporal response measurement; time constant; two-step molecular beam epitaxy growth; wet-chemical-etching free process; Detectors; Extraterrestrial measurements; Molecular beam epitaxial growth; Ohmic contacts; Photoconductivity; Photonic band gap; Pollution measurement; Power measurement; Tellurium; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated Circuit Technology, 1998. Proceedings. 1998 5th International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    0-7803-4306-9
  • Type

    conf

  • DOI
    10.1109/ICSICT.1998.785969
  • Filename
    785969