Title :
Exact calculation of pattern probabilities
Author :
Acharya, Jayadev ; Das, Hirakendu ; Mohimani, Hosein ; Orlitsky, Alon ; Pan, Shengjun
Author_Institution :
ECE, UCSD, La Jolla, CA, USA
Abstract :
We describe two algorithms for calculating the probability of m-symbol length-n patterns over k-element distributions, a partition-based algorithm with complexity roughly 2O(m log m) and a recursive algorithm with complexity roughly 2O(m+log n) with the precise bounds provided in the text. The problem is related to symmetric-polynomial evaluation, and the analysis reveals a connection to the number of connected graphs.
Keywords :
computational complexity; graph theory; pattern recognition; polynomials; statistical distributions; connected graphs; k-element distributions; m-symbol length-n patterns; partition-based algorithm; pattern probabilities; recursive algorithm; symmetric-polynomial evaluation; Convergence; Frequency estimation; Government; Maximum likelihood estimation; Partitioning algorithms; Pattern analysis; Polynomials; Probability; Protection;
Conference_Titel :
Information Theory Proceedings (ISIT), 2010 IEEE International Symposium on
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-7890-3
Electronic_ISBN :
978-1-4244-7891-0
DOI :
10.1109/ISIT.2010.5513565