• DocumentCode
    3066723
  • Title

    Divergence of information-criterion based Markov order estimators for infinite memory processes

  • Author

    Talata, Zsolt

  • Author_Institution
    Dept. of Math., Univ. of Kansas, Lawrence, KS, USA
  • fYear
    2010
  • fDate
    13-18 June 2010
  • Firstpage
    1378
  • Lastpage
    1382
  • Abstract
    For finite-alphabet stationary ergodic processes with infinite memory, Markov order estimators that optimize an information criterion over the candidate orders based on a sample of size n are investigated. Three familiar information criteria are considered: the Bayesian information criterion (BIC) with generalized penalty term yielding the penalized maximum likelihood (PML), and the normalized maximum likelihood (NML) and the Krichevsky-Trofimov (KT) code lengths. A bound on the probability that the estimated order is greater than some order is obtained under the assumption that the process is weakly non-null and α-summable. This gives an O(log n) upper bound on the estimated order eventually almost surely as n → +∞. Moreover, a bound on the probability that the estimated order is less than some order is obtained if the decay of the continuity rate of the weakly non-null process is in some exponential range. This implies that then the estimated order attains the O(log n) divergence rate eventually almost surely as n → +∞.
  • Keywords
    Markov processes; computational complexity; information theory; maximum likelihood estimation; Bayesian information criterion; Krichevsky-Trofimov code lengths; Markov order estimators; finite-alphabet stationary ergodic processes; infinite memory processes; information-criterion divergence; normalized maximum likelihood; penalized maximum likelihood; Bayesian methods; Control theory; Information theory; Mathematics; Maximum likelihood estimation; Probability; Statistics; Testing; Upper bound; Yield estimation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Theory Proceedings (ISIT), 2010 IEEE International Symposium on
  • Conference_Location
    Austin, TX
  • Print_ISBN
    978-1-4244-7890-3
  • Electronic_ISBN
    978-1-4244-7891-0
  • Type

    conf

  • DOI
    10.1109/ISIT.2010.5513580
  • Filename
    5513580