• DocumentCode
    3067171
  • Title

    Necessary and sufficient conditions for high-dimensional salient feature subset recovery

  • Author

    Tan, Vincent Y F ; Johnson, Matthew ; Willsky, Alan S.

  • Author_Institution
    Stochastic Syst. Group, MIT, Cambridge, MA, USA
  • fYear
    2010
  • fDate
    13-18 June 2010
  • Firstpage
    1388
  • Lastpage
    1392
  • Abstract
    We consider recovering the salient feature subset for distinguishing between two probability models from i.i.d. samples. Identifying the salient set improves discrimination performance and reduces complexity. The focus in this work is on the high-dimensional regime where the number of variables d, the number of salient variables k and the number of samples n all grow. The definition of saliency is motivated by error exponents in a binary hypothesis test and is stated in terms of relative entropies. It is shown that if n grows faster than max{ck log((d-k)/k), exp(c´k)} for constants c, c´, then the error probability in selecting the salient set can be made arbitrarily small. Thus, n can be much smaller than d. The exponential rate of decay and converse theorems are also provided. An efficient and consistent algorithm is proposed when the distributions are graphical models which are Markov on trees.
  • Keywords
    Markov processes; computational complexity; information theory; set theory; trees (mathematics); Markov; binary hypothesis test; discrimination performance; error exponents; error probability; graphical models; high-dimensional salient feature subset recovery; probability models; relative entropies; salient set; Decoding; Entropy; Error probability; Graphical models; Pediatrics; Probability distribution; Stochastic systems; Sufficient conditions; Testing; Tree graphs; Binary hypothesis testing; Error exponents; High-dimensional; Salient feature subset; Tree distributions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Theory Proceedings (ISIT), 2010 IEEE International Symposium on
  • Conference_Location
    Austin, TX
  • Print_ISBN
    978-1-4244-7890-3
  • Electronic_ISBN
    978-1-4244-7891-0
  • Type

    conf

  • DOI
    10.1109/ISIT.2010.5513598
  • Filename
    5513598