Hysteresis in floating-body PD/SOI CMOS circuits

Author

Pelella, M.M. ; Chuang, C.T. ; Tretz, C. ; Curran, B.W. ; Rosenfield, M.G.

Author_Institution

LOA, IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA

fYear

1999

fDate

1999

Firstpage

278

Lastpage

281

Abstract

In this paper the hysteretic (history-dependent) propagation gate delay of floating-body (FB) partially depleted (PD) SOI CMOS circuits is investigated. The change in gate propagation delay with time is examined with no preconditioning of the floating-body. The simulation-based analysis includes the sensitivity of the hysteresis to supply voltage, Wp/Wn (beta ratio), duty cycle, slew rate, output load, and initial state of the circuit. Basic physical mechanisms underlying the hysteretic circuit behavior are examined. The results identify the main contributors and general trends of hysteresis in FB PD/SOI circuits. The insight gained can ultimately be incorporated into conventional circuit timing tools. The results also reveal a circuit sizing methodology to minimize the hysteresis effects in circuits using PD/SOI technology

Keywords

CMOS logic circuits; SPICE; circuit simulation; delays; hysteresis; integrated circuit modelling; silicon-on-insulator; timing; PD/SOI technology; SPICE model; beta ratio; circuit sizing methodology; circuit timing tools; duty cycle; floating-body partially depleted SOI CMOS circuits; history-dependent propagation gate delay; hysteresis effects minimization; hysteretic circuit behavior; hysteretic propagation gate delay; initial state; output load; physical mechanisms; simulation-based analysis; slew rate; static CMOS inverter; supply voltage; CMOS logic circuits; CMOS technology; Circuit simulation; Hysteresis; MOS devices; Predictive models; Propagation delay; Pulse width modulation inverters; Semiconductor device modeling; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Technology, Systems, and Applications, 1999. International Symposium on

Conference_Location

Taipei

ISSN

1524-766X

Print_ISBN

0-7803-5620-9

Type

conf

DOI

10.1109/VTSA.1999.786054

Filename

786054