DocumentCode
3067535
Title
Study of electrical and optical properties of InGaN/AlGaN double heterostructure blue light emitting diodes
Author
Shen, B. ; Shi, H.T. ; Yang, K. ; Chen, Z.Z. ; Zhou, Y.G. ; Chen, P. ; Zhang, R. ; Zheng, Y.D.
Author_Institution
Dept. of Phys., Nanjing Univ., China
fYear
1998
fDate
1998
Firstpage
689
Lastpage
692
Abstract
The electrical and optical properties of double heterostructure blue light-emitting diodes, with an In0.06Ga0.94N:Zn,Si active layer, made by Nichia Ltd., were investigated at various temperatures. Measurement of the forward bias current-voltage behavior of the device demonstrates a departure from the Shockley model of p-n diodes, and it is observed that the dominant mechanism of carrier transport across the junction is associated with carrier tunneling. Electroluminescence experiments of the devices indicates that there is an emission peak located at 2.80 eV, and a relatively weaker short-wavelength peak at 3.2 eV. A significant blue shift of the optical emission peak, consistent with the tunneling character of electrical characteristics, was observed. Furthermore, we studied the properties of electroluminescence under various pulsed currents, and a degradation in I-V characteristics and a low resistance ohmic short were observed
Keywords
III-V semiconductors; aluminium compounds; electroluminescence; gallium compounds; indium compounds; light emitting diodes; semiconductor epitaxial layers; spectral line shift; tunnelling; I-V characteristics; In0.06Ga0.94N:Zn,Si; InGaN-AlGaN; blue shift; carrier tunneling; double heterostructure blue LED; electroluminescence; forward bias current-voltage behavior; pulsed currents; Aluminum gallium nitride; Current measurement; Electric variables; Electroluminescence; Electroluminescent devices; Light emitting diodes; P-n junctions; Stimulated emission; Temperature measurement; Tunneling;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State and Integrated Circuit Technology, 1998. Proceedings. 1998 5th International Conference on
Conference_Location
Beijing
Print_ISBN
0-7803-4306-9
Type
conf
DOI
10.1109/ICSICT.1998.786062
Filename
786062
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