• DocumentCode
    3067535
  • Title

    Study of electrical and optical properties of InGaN/AlGaN double heterostructure blue light emitting diodes

  • Author

    Shen, B. ; Shi, H.T. ; Yang, K. ; Chen, Z.Z. ; Zhou, Y.G. ; Chen, P. ; Zhang, R. ; Zheng, Y.D.

  • Author_Institution
    Dept. of Phys., Nanjing Univ., China
  • fYear
    1998
  • fDate
    1998
  • Firstpage
    689
  • Lastpage
    692
  • Abstract
    The electrical and optical properties of double heterostructure blue light-emitting diodes, with an In0.06Ga0.94N:Zn,Si active layer, made by Nichia Ltd., were investigated at various temperatures. Measurement of the forward bias current-voltage behavior of the device demonstrates a departure from the Shockley model of p-n diodes, and it is observed that the dominant mechanism of carrier transport across the junction is associated with carrier tunneling. Electroluminescence experiments of the devices indicates that there is an emission peak located at 2.80 eV, and a relatively weaker short-wavelength peak at 3.2 eV. A significant blue shift of the optical emission peak, consistent with the tunneling character of electrical characteristics, was observed. Furthermore, we studied the properties of electroluminescence under various pulsed currents, and a degradation in I-V characteristics and a low resistance ohmic short were observed
  • Keywords
    III-V semiconductors; aluminium compounds; electroluminescence; gallium compounds; indium compounds; light emitting diodes; semiconductor epitaxial layers; spectral line shift; tunnelling; I-V characteristics; In0.06Ga0.94N:Zn,Si; InGaN-AlGaN; blue shift; carrier tunneling; double heterostructure blue LED; electroluminescence; forward bias current-voltage behavior; pulsed currents; Aluminum gallium nitride; Current measurement; Electric variables; Electroluminescence; Electroluminescent devices; Light emitting diodes; P-n junctions; Stimulated emission; Temperature measurement; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated Circuit Technology, 1998. Proceedings. 1998 5th International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    0-7803-4306-9
  • Type

    conf

  • DOI
    10.1109/ICSICT.1998.786062
  • Filename
    786062