Title :
ProPRED: A probabilistic model for the prediction of residual defects
Author :
Ba, Jie ; Wu, Shujian
Author_Institution :
Sch. of Comput. Sci. & Technol., Beijing Univ. of Aeronaut. & Astronaut., Beijing, China
Abstract :
In this paper, we propose ProPRED, a probabilistic model for predicting residual defects based on Bayesian Networks (BN) in the software development lifecycle. With the chain rule for BN, ProPRED can be used to take the evidence of the influential factors to the activities (Analyze and Design, Development, Maintain, and Review and Test) that bring about the defects introduction and removal to reason and predict the probable residual defects. We refine and classify the influential factors to the four basic activities, and construct the ProPRED. Giving a case study, we conclude that the ProPRED improve its performance in reasoning under uncertainty and convenience in decision-making and quality control.
Keywords :
belief networks; probability; program diagnostics; software engineering; Bayesian networks; ProPRED; decision making; influential factors; probabilistic model; quality control; reasoning under uncertainty; residual defects; software development lifecycle; Bayesian methods; Cognition; Gaussian distribution; Object oriented modeling; Predictive models; Probability distribution; Software; Bayesian Network; defect prediction method; influential factor; probabilistic model; residual defect;
Conference_Titel :
Mechatronics and Embedded Systems and Applications (MESA), 2012 IEEE/ASME International Conference on
Conference_Location :
Suzhou
Print_ISBN :
978-1-4673-2347-5
DOI :
10.1109/MESA.2012.6275569