DocumentCode :
3067808
Title :
Statistical Characterization Of Random Rough Surfaces Using The Tilt Modulation Of The Backscatter Radar Cross Sections: Full Wave Approach
Author :
Bahar, Ezekiel ; Li, Yan-Feng
Author_Institution :
University of Nebraska
fYear :
1990
fDate :
20-24 May 1990
Firstpage :
1401
Lastpage :
1404
Keywords :
Backscatter; Polarization; Probability density function; Radar cross section; Radar scattering; Rough surfaces; Statistics; Surface roughness; Surface waves; Synthetic aperture radar;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Geoscience and Remote Sensing Symposium, 1990. IGARSS '90. 'Remote Sensing Science for the Nineties'., 10th Annual International
Type :
conf
DOI :
10.1109/IGARSS.1990.688762
Filename :
688762
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3067808
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