• DocumentCode
    3068076
  • Title

    Embedded Ch based automatic testing environment for electronic products

  • Author

    Tie, Zhixin ; Ko, David ; Cheng, Harry H.

  • Author_Institution
    Sch. of Inf. Sci. & Technol., Zhejiang Sci-Tech Univ., Hangzhou, China
  • fYear
    2012
  • fDate
    8-10 July 2012
  • Firstpage
    308
  • Lastpage
    313
  • Abstract
    Automatic test environments have been attracting more and more attention from both academic and industrial communities. This paper presents an automatic testing environment for electronic products called the Embedded Ch Based Automatic Testing Environment (ECBATE). Powered by Embedded Ch engine as its test script engine, functions in instrument hardware drivers´ Application Programming Interface (API) libraries can be integrated into the ECBATE, and can be called in test script to instruct the Test Control Computer on how to test electronic products. Test templates, which are specified using a hierarchical tree of nodes, were introduced to represent detailed test programs in the ECBATE. They can be easily set up and executed. The experimental results of testing a real product show that it works very well and is an efficient and convenient system to test electronic products.
  • Keywords
    application program interfaces; authoring languages; automatic test software; electronic products; production engineering computing; program interpreters; quality control; software libraries; API libraries; ECBATE; Embedded Ch Based Automatic Testing Environment; Embedded Ch engine; application programming interface; electronic product testing; instrument hardware drivers; node hierarchical tree; script engine; test control computer; test templates; Automatic testing; Engines; Hardware; Instruments; Libraries; Universal Serial Bus; Automatic testing environment; Unit under test; instrument hardware; test script; test template;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Mechatronics and Embedded Systems and Applications (MESA), 2012 IEEE/ASME International Conference on
  • Conference_Location
    Suzhou
  • Print_ISBN
    978-1-4673-2347-5
  • Type

    conf

  • DOI
    10.1109/MESA.2012.6275580
  • Filename
    6275580