Title :
Survey on the effect of technological metallization and slotting on integrated antenna characteristics
Author_Institution :
Dept. of Comput. Sci. & Telecommun., Nat. Res. Univ. of Electron. Technol., Moscow, Russia
Abstract :
This article contains analysis of influence of metal and dielectric layers, doped regions, and substrate on main antenna characteristics; geometric configuration of metallization and passivating layers. The research was conducted for antennas operating in the frequency range of 5-80 GHz, 0.18 um CMOS technology. Preliminary results show that integrated antennas can allows price reduction up to price of manufacturing of a microcircuit which is being already used in such systems like RFID and mobile systems. Possibility and aspects of applying of designed integrated antennas for data communication channel between different ICs inside same package or within same device were reviewed. Solving of problems mentioned above allows increasing of data transfer rate both inside a package and within device without using lower performance buses on printed boards.
Keywords :
CMOS integrated circuits; data communication; integrated circuit metallisation; microwave antennas; millimetre wave antennas; passivation; slot antennas; CMOS technology; data communication channel; data transfer rate; dielectric layers; doped region; integrated antenna characteristics; microcircuit; passivating layer; printed board; slotting; technological metallization; Antenna radiation patterns; Dipole antennas; Metallization; Reflection coefficient; Slot antennas; antenna parameters; integrated antennas; integrated circuits passivating; metallization; slotting;
Conference_Titel :
Telecommunications Forum (TELFOR), 2012 20th
Conference_Location :
Belgrade
Print_ISBN :
978-1-4673-2983-5
DOI :
10.1109/TELFOR.2012.6419568