Title :
Improved Distance M-ary (d,k) Codes for High Density Recording
Author :
McLaughlin, S.W.
Author_Institution :
Electrical Engineering Department, Rochester Institute of Technology, Rochester, NY
Keywords :
Algorithm design and analysis; Disk recording; Error probability; Euclidean distance; Integrated circuit noise; Linearity; Magnetic recording; Optical recording; Optical saturation; Saturation magnetization;
Conference_Titel :
Magnetic Recording Conference 1994. Signal Processing., Digest of the
Conference_Location :
San Diego, CA, USA
DOI :
10.1109/MRC.1994.641965