Title :
Defect classification of TFT-LCD with bag of visual words approach
Author :
Wei Huang ; Hongtao Lu
Author_Institution :
Shanghai Jiao Tong Univ., Shanghai, China
Abstract :
A defect classification algorithm with bag of visual words approach for thin film transistor liquid crystal display (TFT-LCD) manufacturing is proposed in this paper. Color and SIFT features are introduced to describe defect region. Visual words vocabularies are learnt separated for each features. The two features are separately coded in bag of visual words and combined by multiple chi-square kernel SVM. Classifier performances with different parameters are compared in experiments. Finally a good enough classifier for identifying 5 classes of defect is achieved.
Keywords :
automatic optical inspection; feature extraction; flaw detection; image classification; image colour analysis; liquid crystal displays; production engineering computing; support vector machines; thin film transistors; SIFT features; TFT-LCD defect classification; TFT-LCD manufacturing; bag of visual words approach; classifier performance; color features; defect classification algorithm; defect region classification; liquid crystal display manufacturing; multiple chi-square kernel SVM; thin film transistor; visual words vocabularies; Image color analysis; Inspection; Kernel; Support vector machines; Thin film transistors; Visualization; Vocabulary;
Conference_Titel :
Information and Automation for Sustainability (ICIAfS), 2012 IEEE 6th International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4673-1976-8
DOI :
10.1109/ICIAFS.2012.6419899
