DocumentCode
306979
Title
Optimization-based dynamic scheduling and its testbed for IC sort and test
Author
Yang, Jian ; Chang, Tsu-Shuan ; Chang, Han ; Jen Kao
Author_Institution
Dept. of Electr. & Comput. Eng., California Univ., Davis, CA, USA
Volume
3
fYear
1996
fDate
11-13 Dec 1996
Firstpage
2759
Abstract
A dynamic scheduling system for an IC sort and test facility is developed by using a sort of feedback strategy. The scheduling system will take a snapshot to obtain the current floor information and use an optimizer to come up with a good pragmatic strategy, which is sub-globally optimal in terms of the current information. Dynamic rescheduling is then used to deal with stochastic variations. Before implementing the system in a manufacturing floor, a simulation testbed is developed to evaluate its performance in dynamic environments. Some test results are also presented to indicate its high potential for practical problems
Keywords
feedback; integrated circuit manufacture; integrated circuit testing; optimisation; scheduling; IC sorting; IC testing; dynamic rescheduling; feedback strategy; optimization-based dynamic scheduling; stochastic variations; Circuit testing; Dynamic scheduling; Feedback; Integrated circuit testing; Job shop scheduling; Processor scheduling; Stochastic processes; System testing; Test facilities; Workstations;
fLanguage
English
Publisher
ieee
Conference_Titel
Decision and Control, 1996., Proceedings of the 35th IEEE Conference on
Conference_Location
Kobe
ISSN
0191-2216
Print_ISBN
0-7803-3590-2
Type
conf
DOI
10.1109/CDC.1996.573528
Filename
573528
Link To Document