• DocumentCode
    306979
  • Title

    Optimization-based dynamic scheduling and its testbed for IC sort and test

  • Author

    Yang, Jian ; Chang, Tsu-Shuan ; Chang, Han ; Jen Kao

  • Author_Institution
    Dept. of Electr. & Comput. Eng., California Univ., Davis, CA, USA
  • Volume
    3
  • fYear
    1996
  • fDate
    11-13 Dec 1996
  • Firstpage
    2759
  • Abstract
    A dynamic scheduling system for an IC sort and test facility is developed by using a sort of feedback strategy. The scheduling system will take a snapshot to obtain the current floor information and use an optimizer to come up with a good pragmatic strategy, which is sub-globally optimal in terms of the current information. Dynamic rescheduling is then used to deal with stochastic variations. Before implementing the system in a manufacturing floor, a simulation testbed is developed to evaluate its performance in dynamic environments. Some test results are also presented to indicate its high potential for practical problems
  • Keywords
    feedback; integrated circuit manufacture; integrated circuit testing; optimisation; scheduling; IC sorting; IC testing; dynamic rescheduling; feedback strategy; optimization-based dynamic scheduling; stochastic variations; Circuit testing; Dynamic scheduling; Feedback; Integrated circuit testing; Job shop scheduling; Processor scheduling; Stochastic processes; System testing; Test facilities; Workstations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Decision and Control, 1996., Proceedings of the 35th IEEE Conference on
  • Conference_Location
    Kobe
  • ISSN
    0191-2216
  • Print_ISBN
    0-7803-3590-2
  • Type

    conf

  • DOI
    10.1109/CDC.1996.573528
  • Filename
    573528