DocumentCode :
3070547
Title :
A locally-restricted method for removal of eye-blink artifacts in electroencephalogram measurements
Author :
Kawaguchi, Hirokazu ; Kobayashi, Tetsuo
Author_Institution :
Grad. Sch. of Eng., Kyoto Univ., Kyoto, Japan
fYear :
2012
fDate :
1-4 July 2012
Firstpage :
615
Lastpage :
618
Abstract :
Eye blinks are among the dominant artifacts in electroencephalogram (EEG) recordings. Although several removal methods for eye-blink artifacts have been reported, most of them concurrently removed a part of the original EEGs as well. In this study, we focused on the number of pure EEGs that were retained, and proposed a locally-restricted removal method based on independent component analysis (ICA), empirical mode decomposition (EMD), and the Kalman filter. Simulated and measured results confirmed that the proposed method is more suitable for the local removal of eye-blink artifacts without the loss of EEG information when compared to previous methods.
Keywords :
Kalman filters; biomedical measurement; electroencephalography; eye; independent component analysis; medical signal processing; EMD; ICA; Kalman filter; electroencephalogram measurements; empirical mode decomposition; eye blink artifact removal; independent component analysis; locally restricted method; Educational institutions; Ions; EEG; EMD; Eye-blink artifact; ICA; Kalman filter;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Complex Medical Engineering (CME), 2012 ICME International Conference on
Conference_Location :
Kobe
Print_ISBN :
978-1-4673-1617-0
Type :
conf
DOI :
10.1109/ICCME.2012.6275700
Filename :
6275700
Link To Document :
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