• DocumentCode
    307066
  • Title

    Concurrent sample path analysis of discrete event systems

  • Author

    Cassandras, Christos G. ; Panayiotou, Christos G.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Massachusetts Univ., Amherst, MA, USA
  • Volume
    3
  • fYear
    1996
  • fDate
    11-13 Dec 1996
  • Firstpage
    3332
  • Abstract
    The sample path constructability problem for discrete event systems (DES) involves the observation of a sample path under a particular parameter value θ of the system with the requirement to concurrently construct multiple sample paths of the DES under different values using only information available along the given sample path. This allows the on-line estimation of performance measures of the form J(θ), not available in closed form, over a range of values of θ. We present a sample path coupling approach that solves the problem without imposing any restrictions on the event processes in the system. A specific “time warping” algorithm is described and its performance is analysed in terms of computational cost. We also identify a structural condition on DES, termed regularity: in regular DES the occurrence of any event can never trigger more than one additional event at the next state. We have found that for DES with this property (satisfied by a wide range of systems) concurrent sample path construction techniques are computationally efficient
  • Keywords
    discrete event systems; queueing theory; stochastic automata; concurrent sample path analysis; discrete event systems; online estimation; performance measures; regularity; sample path constructability; sample path coupling approach; structural condition; time warping algorithm; Algorithm design and analysis; Analytical models; Computational efficiency; Concurrent computing; Contracts; Control systems; Design optimization; Discrete event systems; Performance analysis; Stochastic processes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Decision and Control, 1996., Proceedings of the 35th IEEE Conference on
  • Conference_Location
    Kobe
  • ISSN
    0191-2216
  • Print_ISBN
    0-7803-3590-2
  • Type

    conf

  • DOI
    10.1109/CDC.1996.573665
  • Filename
    573665