DocumentCode
3071482
Title
Tomographic microscopy using a plenoptic sensor
Author
Trujillo-Sevilla, J. ; Rodriguez-Ramos, Jose M. ; Rodriguez-Ramos, L.F. ; Javidi, Bahram
Author_Institution
Univ. of La Laguna, La Laguna, Spain
fYear
2013
fDate
15-19 July 2013
Firstpage
1
Lastpage
2
Abstract
Plenoptic sensors have been developed as passive method for 3D scanning of a scene by the intensity of the light. In this work a new method to measure 3D, not by its intensity but its wavefront phase, is presented. Microscopy on translucent or fluorescent samples, can take advantage of this technique. Preliminary studies and simulations are presented to show the feasibility of the technique.
Keywords
fluorescence; image sensors; optical microscopy; optical tomography; optical variables measurement; wavefront sensors; 3D scanning; fluorescent sample; light intensity; passive method; plenoptic sensor; tomographic microscopy; translucent sample; wavefront phase; Extraterrestrial measurements; Image reconstruction; Lenses; Microscopy; Phase measurement; Three-dimensional displays; Tomography; microscopy; plenoptic; tomography; wavefront;
fLanguage
English
Publisher
ieee
Conference_Titel
Information Optics (WIO), 2013 12th Workshop on
Conference_Location
Puerto de la Cruz
Type
conf
DOI
10.1109/WIO.2013.6601246
Filename
6601246
Link To Document